269 results found for MIL-STD-883 method 2018
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
MNFR
Detail / Drawing
2017-TS-001 / -
Active
The base HS-26C32RH is acceptance tested on a wafer-by-wafer basis to 300krad(Si) at High Dose Rate (HDR) (50–300rad(Si)/s). At LDR, (0.01rad(Si)/s maximum). The...
TD
/ 0.00
Active
DLA
Generic
E / -
Active
DLA
Detail / Drawing
D / -
Active
DLA
Detail / Drawing
B / -
Active
MNFR
Detail / Drawing
2 / -
Active
DLA
Detail / Drawing
C / -
Active
ADI
Detail / Drawing
E / -
Active
MNFR
Detail / Drawing
2 / -
Active