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242 results found for MIL-STD-883 method 2015

Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status

MFR SPEC ASD0010965 EM

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12-Bit, 3 MSPS, A to D Converter, AD1672
MNFR
Detail / Drawing
O / -
Active

MIL-PRF-32535

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Capacitor, Chip, Fixed, Ceramic Dielectric (Temperature Stable and General Purpose), Extended Range, High Reliability and Standard Reliability, General Specification for
DLA
Generic
A / -
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ESCC 9301/050

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INTEGRATED CIRCUITS, SILICON MONOLITHIC, CMOS 8K X 16 DUAL-PORT SRAM WITH THREE STATE OUTPUTS BASED ON TYPE 67025E
ESCC
Detail / Drawing
2 / -
Active

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Total ionization ISL70003ASEH
total dose of the ISL70003ASEH. Parts were tested at low and high dose rate under biased and unbiased conditions, to a total dose of 150krad(Si) at high dose rate and...
TD
/ 1.00
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MFR SPEC OCE1D1G16xS66xx1T7B

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OCE1D1G16xS66xx1T7B DDR SDRAM Detailed Product Specification
MNFR
Detail / Drawing
2020-TS-004 / -
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MFR DS 028541

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Rad-hard quad LVDS driver, RHFLVDS315
MNFR
Detail / Drawing
2 / -
Active

5962-01514

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Microcircuit, Hybrid, Linear, MIL-STD-1553, BC_RTU_MT, Multiplexed Terminal
DLA
Detail / Drawing
F / -
Active

MFR DS 027588

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Rad-hard, dual 4x4 crosspoint switch LVDS, RHFLVDS2281
MNFR
Detail / Drawing
1 / -
Active

5962-94615

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Microcircuit, Digital, Advanced Bipolar CMOS, Scan Test Device with Octal Registered Bus Transceiver, Three-State Outputs, TTL Compatible Inputs, Monolithic Silicon
DLA
Detail / Drawing
C / -
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TR021

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Total ionization ISL71831SEH
Total dose testing of the ISL71831SEH is complete and showed no reject devices after irradiation up to 75krad(Si) or after the post-75krad(Si) irradiation anneal.
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