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53 results found for MIL-STD-883 Method 2007 for integrated circuits.

Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status

MIL-STD-883, Method 5011

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Electrical Test Method Standard for Microcircuits: Evaluation and acceptance procedures for polymeric adhesives.
This method establishes the minimum inspection procedures and acceptance criteria for polymeric materials used in microcircuit applications.
DLA
Method
7 /
Active

ESCC 9010

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Generic Specification for Microwave Monolithic Integrated Circuits
ESCC
Generic
3 / -
Active

JAXA-QTS-2010

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Integrated Circuits, High Reliability, Space Use, General Specification for
JAXA
Generic
C / -
Active

MIL-PRF-38535

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Integrated Circuits (Microcircuits) Manufacturing, General Specification For
DLA
Generic
M / -
Active

NASDA-QTS-1025

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Integrated Circuits, Hybrid, General Specification for
JAXA
Generic
B / -
Active

JAXA-QTS-2025

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Integrated Circuits, Hybrid, (Class II) General Specification for
JAXA
Generic
- / -
Active

JAXA-QTS-2020

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Integrated Circuits, Hybrid, High Reliability, Space Use, General Specification for
JAXA
Generic
B / w/Notice of Change 1
Active

ESCC 9030

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Generic Specification for Integrated Circuits: Monolithic Microcircuits, Wire-Bonded, Plastic Encapsulated and Flip-Chip Monolithic Microcircuits, with Organic Substrate
ESCC
Generic
2 / -
Active

ESCC 9000

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Generic Specification for Integrated Circuits: Monolithic And Multichip Microcircuits,Wire-Bonded, Hermetically Sealed And Flip-Chip Monolithic Microcircuits, Solder Ball Bonded, Hermetically And Non-Hermetically Sealed
ESCC
Generic
11 / -
Active

JAXA-QTS-2010/102

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Integrated Circuits, 36M-BIT Burst SRAM, CMOS, Multichip Silicon, High Reliability, Space Use, Detail Specification for
JAXA
Detail / Drawing
A / -
Active