214 results found for MIL-STD-883 Method 2002
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
This method establishes the minimum inspection procedures and acceptance criteria for polymeric materials used in microcircuit applications.
DLA
7 /
Active
The shock test is intended to determine the suitability of the devices for use in electronic equipment which may be subjected to moderately severe shocks as a result...
DLA
5 /
Active
This method establishes qualification and quality conformance inspection procedures for microelectronics to assure that the device and lot quality...
DLA
17 /
Active
The purpose of this examination is to nondestructively detect defects within the sealed case, especially those resulting from the sealing process, and internal defects...
DLA
11 /
Active
This method establishes screening, qualification, and quality conformance requirements for the testing of complex monolithic microcircuits to assist in...
DLA
4 /
Active
This method provides means for establishing or evaluating the maximum capabilities of microelectronic devices, including such capabilities as absolute...
DLA
/
Active
DLA
Detail / Drawing
B / -
Active
DLA
Detail / Drawing
- / -
Active
DLA
Detail / Drawing
01/05/2002 / -
Active
DLA
Detail / Drawing
01/07/2002 / -
Active