242 results found for MIL-STD-883 method 2015
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
DLA
1 /
Supersed
The purpose of this test is to verify that the markings will not become illegible on the component parts when subjected to solvents.
DLA
14 /
Active
This method establishes qualification and quality conformance inspection procedures for microelectronics to assure that the device and lot quality...
DLA
17 /
Active
The purpose of this test is to inspect passive elements used for microelectronic applications, including RF/microwave, for the visual defects described herein.
DLA
3 /
Active
This method establishes screening, qualification, and quality conformance requirements for the testing of complex monolithic microcircuits to assist in...
DLA
4 /
Active
The purpose of this test is to determine a representative failure rate for microelectronic devices or to demonstrate quality or reliability of devices subjected to the...
DLA
1 /
Active
ESCC
Detail / Drawing
1 / -
Active
MNFR
Detail / Drawing
D / -
Active
MNFR
Detail / Drawing
D / -
Active
DLA
Detail / Drawing
- / -
Active