TR022 Total ionization ISL72026SEH, ISL72027SEH, ISL72028SEH

Parts were tested to 75krad(Si) at low dose rate under biased and unbiased conditions, and were then subjected to a high temperature biased anneal at +100°C for 168 hours. ATE characterization testing at downpoints showed no rejects to the parametric limits. No differences between biased and unbiased irradiation were noted and the part is not considered bias sensitive.