TR059 Total ionization HS-26C31EH

Parts were tested at LDR under biased and unbiased conditions and at HDR under biased conditions as part of routine production acceptance testing, to a total dose of 150krad(Si) (LDR) and 300krad(Si) (HDR). Testing at both dose rates showed zero rejected devices to either internal guardbanded ATE limits or the SMD pre-radiation limits, noting that the SMD pre-irradiation and post-radiation limits are the same for this part. The part is considered ELDRS-free, and no bias sensitivity was noted.