MIL-STD-750, Method 3453 Transistor Electrical Test Methods for semiconductor Devices Part 3: Small-signal, common-source, short-circuit, output admittance
General data
The purpose of this test is to measure the output admittance of the field-effect transistor under the specified small-signal conditions.
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09/12/2019 0:00:00
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MIL-STD-750, Method 3453
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