MIL-STD-750, Method 2069 Mechanical Test Methods for Semiconductor Devices Part 2: Pre–cap visual, power MOSFET's
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The purpose of this test method is to verify the construction and quality of workmanship of semiconductor devices in the assembly process to the point of pre–cap inspection.
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MIL-STD-750, Method 2069
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MIL-STD-750, Method 2069
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