MIL-STD-750, Method 2074 Mechanical Test Methods for Semiconductor Devices Part 2: Internal visual inspection (discrete semiconductor diodes)
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The purpose of this test method is to check the materials, design, construction, and workmanship of discrete semiconductor diodes and other two-terminal semiconductor devices described herein.
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MIL-STD-750, Method 2074
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MIL-STD-750, Method 2074
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