MIL-STD-750, Method 2081 Mechanical Test Methods for Semiconductor Devices Part 2: Forward instability, shock (FIST)
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This test method is intended to detect any semiconductor device discontinuity "ringing" or shifting of the forward dc voltage characteristic monitored during shock.
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MIL-STD-750, Method 2081
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MIL-STD-750, Method 2081
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