MIL-STD-750, Method 1019 Environmental Test Methods for Semiconductor Devices Part 1: Steady–state total dose irradiation procedure
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This test method defines the requirements for testing discrete packaged semiconductor devices for ionizing radiation (total dose) effects from a Cobalt-60 (60Co) gamma ray source.
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MIL-STD-750, Method 1019
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MIL-STD-750, Method 1019
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