MIL-STD-883, Method 1006 Environmental Test Method Standard for Microcircuits: Intermittent life

General data

The intermittent life test is performed for the purpose of determining a representative failure rate for microelectronic devices or demonstrating quality or reliability of devices subjected to the specified conditions.
Active
16/09/2019 0:00:00
0 pages

Document history

Reference
Revision
MIL-STD-883, Method 1006
K

Document preview

Previous
{{docCtrl.currentPage}} of {{docCtrl.totalPages}} Pages
Next

Related documents

Related documents