MIL-STD-202, Method 311 Electronic and Electrical Component Parts: Life, Low Level Switching
General data
This test is conducted for the purpose of determining electrical contact reliability under low-level switching conditions in the environment in which the contacts operate.
Active
18/04/2015 0:00:00
0 pages
Document history
Document preview
Previous
{{docCtrl.currentPage}} of {{docCtrl.totalPages}} Pages
Next