MIL-STD-750, Method 4031 Diode Electrical Test Methods for Semiconductor Devices Part 4: Reverse recovery characteristics
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The purpose of this test method is to measure the reverse recovery time and other specified recovery characteristics related to signal, switching, and rectifier diodes by observing the reverse transient current versus time when switching from a specified forward current to a reverse biased state in a specified manner.
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MIL-STD-750, Method 4031
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