MIL-STD-750, Method 4036 Diode Electrical Test Methods for Semiconductor Devices Part 4: Quality factor (Q) for voltage variable capacitance diodes
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The purpose of this test method is to measure the quality factor (Q) of the device. By definition, Q expresses the ratio of reactance to effective resistance of the device, under RF signal conditions and specified dc bias conditions.
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MIL-STD-750, Method 4036
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