MIL-STD-750, Method 4102 Diode Electrical Test Methods for Semiconductor Devices Part 4: Microwave diode capacitance
General data
The purpose of this test is to measure the low frequency capacitance of a semiconductor diode. The capacitance is the small signal capacitance of the diode as measured in a defined test holder under specified bias conditions.
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MIL-STD-750, Method 4102
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