MIL-STD-750, Method 4022 Diode Electrical Test Methods for Semiconductor Devices Part 4: Breakdown voltage (voltage regulators and voltage-reference diodes)
General data
This test method is designed to measure the breakdown voltage of voltage regulator and voltage-reference semiconductor devices under the specified conditions.
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30/12/2019 0:00:00
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MIL-STD-750, Method 4022
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