MIL-STD-750, Method 4065 Diode Electrical Test Methods for Semiconductor Devices Part 4: Peak reverse power test
General data
This describes a test method for subjecting the device under test (DUT) to a high power stress condition in the reverse direction of rectifiers to determine the ability of the device to withstand a specified peak reverse power.
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30/12/2019 0:00:00
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MIL-STD-750, Method 4065
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