MIL-STD-750, Method 3104 Transistor Electrical Test Methods for semiconductor Devices Part 3: Thermal resistance measurements of GaAs MOSFETs (constant current forward-biased gate voltage method)
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The purpose of this test is to measure the thermal resistance of the MOSFET under the specified conditions of applied voltage, current, and pulse width.
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09/12/2019 0:00:00
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MIL-STD-750, Method 3104
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