MIL-STD-750, Method 1056 Environmental Test Methods for Semiconductor Devices Part 1: Thermal shock (liquid to liquid)
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This test method is conducted to determine the resistance of the semiconductor device to sudden exposure to extreme changes in temperature and to the effect of alternate exposures to these extremes.
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MIL-STD-750, Method 1056
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MIL-STD-750, Method 1056
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