MIL-STD-750, Method 1051 Environmental Test Methods for Semiconductor Devices Part 1: Temperature cycling (air to air)
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This test method is conducted to determine the resistance of a semiconductor device to extremes of high and low temperatures, and to the effect of alternate exposures to these extremes.
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MIL-STD-750, Method 1051
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MIL-STD-750, Method 1051
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