MIL-STD-883, Method 1007 Environmental Test Method Standard for Microcircuits: Agree life
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The purpose of this test is to determine a representative failure rate for microelectronic devices or to demonstrate quality or reliability of devices subjected to the specified conditions where test conditions include a combination of temperature cycling, on-off electrical stressing and vibration to simulate as closely as possible actual system applications and environments.
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MIL-STD-883, Method 1007
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