Using a Fluorescence Microscopy + dye penetrant test on EEE Parts

Practical examples

Main advantages of the technique lie on the dual specificity of the fluorescence phenomena which is exclusively activated under specific illumination wavelength (excitation light color) and provides wavelength-specific light emission (specific emission color). This allows us to unambiguously identify surface anomalies difficult to be resolved by naked-eye inspection. Due to the simplicity, the non-destructive character and the high sensitivity both conventional dye penetration test and the fluorescent microscopy dye-penetration test are commonly used not only in space and aerospace sectors but also in other fields requiring of completely crack free materials such as oil and gas industry and power generation.

In Alter Technology dye penetrant testes are routinely used to verify the hermeticity of EEE parts by visual fluorescence inspection. In addition, we offer doEEEt the only tool that provides you the most complete and updated information about Hi-Rel EEE parts. 

To improve the quality of our inspections processes they are also included within the verification protocol of high-reliability surface mounted devices and other PCB systems. The figure shows one representative example of the latter application. Pictures at the left correspond to the cross-section of a soldered SMD leaded-device. In the figure on the top, it is evident the presence of a crack at the solder however this optical image does not reveal the actual crack length. In this case, fluorescence microscopy is used to disclose how the crack extends along the solder lead interface and determine the length of the crack which is a critical rejection/acceptance criteria.

Optical Image

Fluorescence microscopy after dye infiltration

Crack extending along the base os a SMD device

As an additional advantage related to this example, with the Fluorescence Microscopy since dye infiltration is conducted before microsection only those crack present before cutting are outlined. Therefore, fluorescent inspection allows us to discard other features that eventually might be produced during microsection. This and other characterizes makes it a valuable tool for failure analyses. In other application (picture beside) the technique is used to analyze wire separation in crimped connectors.

Figure: Wire separation in crimped connectors

Due to the fluorescent mechanism (see next section) proper fluorescence inspection requires the suitable selection of the fluorescent tag and the optical systems adapted to the fluorescence characteristics of the fluorophore (excitation lamps, fluorescence filters, and others). With these concerns Alter Technology team consist of experienced researchers in materials science and fluorescence techniques.

How it works

Fluorescence is the emission of light observed when some chemical elements (rare earth) organic compounds (organics dyes) and other confined materials (Quantum dots) are irradiated, typically with short-wavelength (UV) light. Taking as an example of an organic fluorophore, fluorescence emission is excited when a photon is absorbed by a substance. Subsequent to this excitation process the fluorophore is promoted to a high electronic level as illustrated by the Jablonski diagram (picture beside). In the excited state, the molecule undergoes very fast non-emitting dissipation processes and transition toward the lower sub-vibration level of the excited state. In fluorescent compounds, the remaining excess of energy is released in form of light at wavelengths characteristic the used fluorophore. In general, fluorescence emission is less energetic (longer wavelength) that the excitation beam as consequences of the previously mentioned excited-state dissipation processes. The wavelength difference between the excitation and emission wavelength is denominated stokes shift. This is an important factor for the deselection of the suitable fluorophore depending on the intending application. For marking proposes large Stokes shift is very recommended to filter out the reflection of the excitation beam from the emission signal