Alter Technology SAM Testing Capabilities
- Posted by Francisco Javier Aparicio Rebollo
- On June 17, 2019
- 0
Scanning Acoustic Microscopy Service
- A-scan, B-scan, C-scan, and Through-scan
- Circuit, non-circuit, and through-transmitted signal are systematically inspected at different focal depths
- Delamination (phase inversions) is confirmed by A-scan mode
Depth mapping
FT data treatment
Full area A-scan records upon request
Read More about SAM Test Flow and Procedures
Contact us
Co-authors: David Ramírez-Cruzado Monge; Jose Cándido Vázquez, Dimas Morilla Mairen, Manuel Domínguez Álvarez, Antonio Rodríguez Arenas.
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