Zero-Error Systems (ZES) ordering part number revision

Posted by Emilio Cano García
On June 13, 2024
0

Zero-Error Systems (ZES) updates part numbers for ZES100 and ZES400 space-grade components. Learn about the new part numbers and features of these critical products designed for high radiation tolerance and latchup protection in space applications.

EEE Components, INSPECTION, ELECTRICAL & VERIFICATION, PASSIVES, TESTING

Current limiting IC’s for Space Applications

Posted by José Francisco Largaespada
On December 25, 2020
0

Current limiting is a basic block element of any power supply. Many electronic devices are powered almost 100% of the time and are usually unattended, and therefore safety methods like current limit devices are essential to protect and improve the good performance of the equipment. In this sense, current protection is even more important in space applications, not only because of the criticality of the missions and the unavailability of repair but also because the possibility of Single Event Latch-up

EEE Components, PASSIVES

Single Event Latchup Protection Circuits

Posted by Alejandro López Moya
On June 14, 2020
0

Single event effects (SEE’s) are one of the most common problems that electronic devices, mainly CMOS and bipolar integrated circuits, must fight when they are used in space applications.

ACTIVES, EEE Components

SEL protection for Space Applications

Posted by Sonia Vargas
On June 14, 2020
4

There are several strategies in order to protect circuits from Single Event Latch-Up. Implementing such protection with Current Limiters is a versatile and programmable option. However, this part types must be evaluated under certain stress sources related to space applications, where a set of electrical parameters are measured during the process. Here are presented the typically used ones.