SiC Testing: Heavy ions test using SiC power devices

Posted by doEEEt Media Group
On February 19, 2021
0

New failure modes not observed in Silicon appear while testing SiC MOSFET and Schottky diodes and under heavy ions radiation. Gate damage in transistors remains undetected even monitoring drain current and gate leakage of the transistor under high voltage biasing conditions.

ALTER Innovation, ENDURANCE, ENVIRONMENTAL & RADIATION, TESTING

Radiation Test to study the radiation tolerance – ASIC for DAMPE Mission

Posted by doEEEt Media Group
On February 17, 2021
0

Laser test was performed firstly to quality the SEL sensitivity because it is easy and ready at all times. Heavy ion beam teat was executed secondly to quantify the SEL tolerance of the ASICs.

EEE Components, PASSIVES

The Current State and Perspectives of Laser Radiation Hardness

Posted by doEEEt Media Group
On September 4, 2020
0

Laser beam brings unique capabilities for radiation hardness evaluation and testing of electronic components and systems. The presentation describes various laser techniques and approaches for radiation effects testing and research used in Russia by NRNU MEPhI and SPELS: SEE sensitivity parameter estimation and confirmation, IC chip de-capsulation and identification, etc. The brief compendium of laser tests during the last years is also provided.

ALTER Innovation, ALTER Projects

Radiation Test experience at BMTI

Posted by doEEEt Media Group
On March 6, 2020
0

Some background information about BMTI will be introduced. 1. Using built-in self-test (BIST) structures for SEE test BIST structures, scan chains and memory-BIST, are used in SEE hardness assurance of BMTI’s IC products. The basic principle, consideration and skills will be given. Some implications for SEE assurance will be discussed.

ALTER Innovation, ALTER Projects

Assessing Radiation Hardness of SIC MOS Structures

Posted by doEEEt Media Group
On February 24, 2020
0

SEE testing of the lateral MOS revealed no sensitivity of the devices to heavy ions. A possible explanation for this could be that damage in vertical DMOS is mainly located in the JFET area between p-wells which is submitted to higher electric fields.

ALTER Innovation

SEE testing on GaAs test vehicles. Methodology, Results and Derating.

Posted by doEEEt Media Group
On February 19, 2020
0

Radiation sensitivity of GaAs components is not really well known, compare to other technologies. Traditional radiation harness policy consisted in a good derating in DC bias conditions to ensure operation inside a known or expected DC safe operating area (SOA).

ALTER Innovation, ENDURANCE, ENVIRONMENTAL & RADIATION, TESTING

Working on the developing of a European standard for DD testing

Posted by doEEEt Media Group
On February 19, 2020
0

Propose a DD test standard • Should be available by the end of the year after ESA and Components Technology Board (CTB)/Radiation Working group (RWG) comments • Goal of this presentation ⇒ Not a draft of the future guidelines, but: • Remind the physical processes responsible of the displacement damages • Remind the electrical effects • List the main parameters that should be taken into account

ALTER Innovation, ENDURANCE, ENVIRONMENTAL & RADIATION, TESTING

Component and System Testing at the CHARM Mixed-Field Facility – CERN

Posted by doEEEt Media Group
On February 17, 2020
0

The new CERN High energy AcceleRator Mixed Field facility (CHARM) allows to test several single components, as well as more complex devices, at different locations, characterized by particle spectra representative of the high- and low-altitude atmospheric, particle accelerator and ground environments.

ALTER Innovation, ENDURANCE, ENVIRONMENTAL & RADIATION, TESTING

Emulation and failure injection, a complement to Radiation Test

Posted by doEEEt Media Group
On February 17, 2020
0

Fault Injection is an inexpensive technique that during design time, refine the design for the test fixture, improve the quality of stimuli, in order to maximize the error rate, and test the design observability.

ALTER Innovation, ENDURANCE, ENVIRONMENTAL & RADIATION, Small Sats Testing, TESTING

The NaoSat nanosatellite platform for in-flight radiation testing

Posted by doEEEt Media Group
On February 17, 2020
0

A modular architecture specifically designed for integrating technology demonstrators and test applications in a fast-to-orbit cycle allows any interested team to prepare its payload for flight into orbit in less than 1 year.

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