ALTER Projects, Optoelectronics Components Testing

Near-infrared, visible and ultraviolet LIDAR echo emulator

Posted by doEEEt Media Group
On October 26, 2021
0

Space agencies have carried out numerous research projects to develop systems to detect and quantify the concentration of Greenhouse gases, such as carbon dioxide and methane, which are the main drivers of climate change. The measurement system used for this purpose is called LIDAR (Light Detection and Ranging).

Optoelectronics Components Testing

Electro-optical characterization of 25 Gbps/s Optical Transceivers

Posted by Alejandro Rosado Pérez
On October 8, 2021
0

Optical transceivers are small photonics devices that can transmit and receive information at high transmission rates. These kinds of photonics chips are constituted by two differentiated parts: the transmitter, and the receiver.

Optoelectronics, TESTING

Development of a NIR-VIS-UV lidar echo emulator

Posted by Pawel Adamiec
On October 7, 2021
0

The LEE capable of emulating the echoes of a spatial lidar at three wavelengths (355 nm, 532 nm, and 1064 nm) was developed. In general, it enables the characterization of the critical optical parameters of the detection chain of a space or airborne lidar. The LEE allows short overlapping echo with long echo with 63 dB dynamic range. In-depth characterization of the lidar detection module will evaluate compliance with the requirements for which it was designed and feed future designs with actual figures from the lidar detection chain.

Optoelectronics

LIDAR echo emulator

Posted by Pawel Adamiec
On October 7, 2021
0

The LIDAR Echo Emulator (LEE) emulates the returned signals from a Lidar system. As the return signal of a Lidar system depends on the target, this implies the capability of shaping the laser’s returns. In brief, a long echo corresponds to a natural or diffusive object (canopy, clouds) and short echoes to a complex thing like roofs, ground, etc. Such signals must be simulated to study and validate new detectors and detection systems without developing/procuring the entire Lidar system.

Optoelectronics Components Testing

Photonic Integrated Circuits radiation for harsh environments

Posted by David Poudereux Sánchez
On September 23, 2021
0

The satellite market is experiencing a paradigm shift with the photonics penetration in every part of the satellite payload. Although some advances have been done with the introduction of optical interconnects in a commercial digital processor of a satellite payload.

Optoelectronics Components Testing

Calibration sources characterization in vacuum conditions

Posted by Alejandro López Moya
On September 23, 2021
0

One of our customers requested that we carry a thermal cycling test at extreme temperatures (between 93ºC and -178ºC) over some VIS-NIR calibration sources (five samples at a time). At the same time, these sources were tested in vacuum conditions, and electro-optical characterization at different temperatures during cycling was requested.

Optoelectronics Components Testing

Electrical characterization at 500ºC for GRACE project

Posted by Juan Moreno Echarri
On August 26, 2021
0

The GRACE project is framed within the main challenges of our society, particularly safe, efficient, and clean energy, while connecting with aspects of security, safety, and defense, as well as climate change and efficiency in the use of resources raw materials.

Non-standard testing

Characterization of the Image Sensors according to the EMVA 1288 standard and beyond

Posted by Pawel Adamiec
On July 26, 2021
0

We have developed an EMVA 1288 standard compliant system for characterizing image sensors in a wide wavelength range and developed a low-cost camera to drive different types of image sensor.

Optoelectronics Components Testing

Evaluation of optical switches without moving parts for space applications

Posted by David Poudereux Sánchez
On July 21, 2021
0

In this case, we will show you how we selected the devices, the electro optical characterization and the results and conclusions we obtained at the end of this test campaign.

Optoelectronics Components Testing

IR sources thermal vacuum cycling characterization

Posted by Alejandro López Moya
On July 19, 2021
0

Every time a component is tested in extreme temperature conditions, it becomes a challenge to design a reliable test setup. If in addition, components must be in vacuum conditions and electro-optical characterization is required at different temperatures, complexity increases exponentially.

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