New JSN Series manufactured by Kemet
- Posted by Manuel Sánchez Ruiz
- On August 14, 2019
- 0
New JSN Series manufactured by Kemet: Unencapsulated Stacked Chip with Flat Terminations, 63-250 VDC, for DC Link
Issue 38 of EUROPEAN PREFERRED PARTS LIST (EPPL)
- Posted by Emilio Cano García
- On August 12, 2019
- 0
The changes in issue 38 of EUROPEAN PREFERRED PARTS LISTS (EPPL) are included in the DCR 1277 and detailed herein
Tantalum Capacitors from Kemet no longer subjet to Chinese tarifs
- Posted by Kemet Electronic Corporation
- On July 18, 2019
- 0
KEMET Corporation has announced that its request to have Tantalum Polymer capacitors excluded from the Section 301 Chinese tariffs has been approved by the U.S. Trade Representative
Electricity 101
- Posted by Kemet Electronic Corporation
- On July 5, 2019
- 0
The electric grid is the network through which the power is generated, transmitted, and distributed to consumers.
KEMET New SMD Inductor Range Addresses Power Density and Efficiency
- Posted by Kemet Electronic Corporation
- On June 21, 2019
- 0
Devices in the new METCOM series are ideal for developing more efficient DC to DC switching power supplies as well as other power-related applications including EMI filtering.
2nd PCNS Passive Components Networking Symposium
- Posted by doEEEt Media Group
- On June 17, 2019
- 0
Leading passive components manufacturers will discuss hot products, application notes and latest technology during the 2nd Passive Components Networking Symposium on 11th September 2019 in Bucharest, Romania
Radiation Characterisation for New Tantalum Polymer Capacitors
- Posted by doEEEt Media Group
- On June 14, 2019
- 0
Polymer tantalum capacitor technology was developed in response to demands from the market to lower the ESR of tantalum capacitors while preserving their small case size and high reliability. The technology is promising in several aspects. The higher quality interface between the dielectric and the polymer cathode increases the breakdown voltage of the device, as well as reducing its DC leakage current, even at extreme radiation exposure conditions.