SiC Schottky diodes under extreme temperatures

Posted by doEEEt Media Group
On December 21, 2021
0

Read and download the full datasheet of one of our components. This component also has been included in the ESCC 5106/022 specification, and listed in the EPPL (European Preferred Part List).

Non-standard testing

Angular Sensors Measurements in Vacuum and Temperature

Posted by Alina Spuma,
On December 1, 2021
0

A typical qualification campaign for space applications comprises environmental tests like thermal cycling and vacuum temperature test.

Non-standard testing

Cryogenic 4K Capacitors Thermal Test

Posted by doEEEt Media Group
On November 30, 2021
0

The lowest cryogenic temperatures achievable with liquid nitrogen systems are 77K. To lower temperatures further, it is necessary to use other systems. Helium cryostats can use this noble gas to cool a plate and reach temperatures of 4K. All these processes must be done in a vacuum since the air doesn’t allow the temperature.

Non-standard testing

Characterization of Strain Gages at Harsh Environments

Posted by Juan Barbero
On October 8, 2021
0

The Strain Gages are used to measure the deformation of materials. These devices are widely used when the deformation of a structure is relevant such as the wings of a plane or the structure of telescopes or rockets.

SiC Testing

SiC Testing: Heavy Ions tolerant SiC diodes

Posted by doEEEt Media Group
On October 4, 2021
0

Alter RADNEXT Transnational Access reviewers have accepted technology HISiC (Heavy Ions tolerant SiC diodes configurations) project proposal with H2020 funding. SiC weakness under heavy ions radiation is not a secret. The radiation improved SiC multi-die configuration modules will be tested in this project, demonstrating SOAs (Safe Operating Area) up to voltages requested by industry.

Optoelectronics Components Testing

Photonic Integrated Circuits radiation for harsh environments

Posted by David Poudereux Sánchez
On September 23, 2021
0

The satellite market is experiencing a paradigm shift with the photonics penetration in every part of the satellite payload. Although some advances have been done with the introduction of optical interconnects in a commercial digital processor of a satellite payload.

Optoelectronics Components Testing

Calibration sources characterization in vacuum conditions

Posted by Alejandro López Moya
On September 23, 2021
0

One of our customers requested that we carry a thermal cycling test at extreme temperatures (between 93ºC and -178ºC) over some VIS-NIR calibration sources (five samples at a time). At the same time, these sources were tested in vacuum conditions, and electro-optical characterization at different temperatures during cycling was requested.

Optoelectronics Components Testing

Electrical characterization at 500ºC for GRACE project

Posted by Juan Moreno Echarri
On August 26, 2021
0

The GRACE project is framed within the main challenges of our society, particularly safe, efficient, and clean energy, while connecting with aspects of security, safety, and defense, as well as climate change and efficiency in the use of resources raw materials.

EEE Components, PASSIVES

Bourns Introduces AEC-Q200 Compliant CANbus Inductor Series

Posted by doEEEt Media Group
On August 10, 2020
0

Bourns, Inc., introduced a new CANbus Common Mode Chip Inductor series. The new AEC-Q200 compliant inductors feature a ferrite core with a bifilar-wound construction that provides high impedance over a broad frequency range to suppress unwanted incoming or outgoing EMI signals.

EEE Components, PASSIVES

Temperature Measurement and Silicon-Based Temperature Sensors

Posted by doEEEt Media Group
On August 10, 2020
0

Würth Elektronik Webinar for Industrial Applications

This webinar shows trends in temperature measurement. The different technology approaches of temperature sensors are shown.

In the further course, the focus will be on silicon-based temperature sensors with a digital interface.

In this context, the essential features of the new temperature sensor WSEN-TIDS from Würth Elektronik...

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