X-Ray Inspection applied to Screening Test

Posted by doEEEt Media Group
On April 26, 2022
0

Screening procedures assist in achieving quality and reliability levels commensurate with the intended application. The screening test does not increase the reliability of the components but removes those showing weakness or defects.

EEE Components, ENDURANCE, ENVIRONMENTAL & RADIATION, PASSIVES, TESTING

ESR Degradation in Polymer Tantalum Capacitors during Hi Temp Storage

Posted by doEEEt Media Group
On December 27, 2020
0

Different types of polymer capacitors from three manufacturers have been stored at temperatures from 100 ºC for periods up to 18,500 hours to 175 ºC for up to 2000 hours.

EEE Components, PASSIVES

Kemet Continue to Toughen Up Polymer Tantalum Capacitors

Posted by Kemet Electronic Corporation
On October 17, 2020
0

Leading passive components manufacturers will discuss hot products, application notes and latest technology during the 2nd Passive Components Networking Symposium on 11th September 2019 in Bucharest, Romania

EEE Components, PASSIVES

KEMET T-598 Tantalum Polymer Capacitors

Posted by Kemet Electronic Corporation
On October 17, 2020
0

These devices uniquely address the stringent requirements and new challenges presented by megatrend applications in automotive Advanced Driver Assistance Systems (ADAS), autonomous driving and in digitalization uses such as supercomputing, mobility services, connectivity and infotainment. T598 automotive grade polymer electrolytic devices combine multiple high-performance characteristics including high capacitance/voltage (CV) ratings, single-digit equivalent series resistance (ESR), class-leading ripple performance, and ultra-extended life to truly enable the development and deployment of exciting and revolutionary technologies.

ENDURANCE, ENVIRONMENTAL & RADIATION, INSPECTION, ELECTRICAL & VERIFICATION, TESTING

The Importance of Screening in Electronic Components

Posted by Javier Alejandro de la Ossa Fernández
On September 29, 2020
0

Tests, inspections or combination thereof, imposed on 100% of parts to remove unsatisfactory items or those likely to exhibit early failures. Using stress testing, defects are weeded out in a product where the root causes cannot be eliminated. Removing all the defective parts (infant mortality) brings the lot to the constant failure rate (working life) phase. The screening does not increase the reliability of the components but removes those showing weakness or defects. Tests, inspections or combination thereof, imposed on 100% of parts to remove unsatisfactory items or those likely to exhibit early failures.

ENDURANCE, ENVIRONMENTAL & RADIATION, TESTING

What is a Life Test in a Electronic Components?

Posted by Javier Galnares
On June 6, 2020
0

Life test is an electrical stress test that typically employs voltage and/or temperature to accelerate the appearance of wear-out reliability failures in a device. The objective of life testing is to evaluate whether failures caused by wear-out are likely to occur during the product lifetime and thus to estimate compliance of the device with the long-term reliability requirements

ALTER Laboratory Services, ENDURANCE, ENVIRONMENTAL & RADIATION

Burn-in Test Features

Posted by Antonio Amigo
On February 14, 2020
0

Is an electrical stress test that typically employs voltage and/or temperature to accelerate the appearance of latent reliability defects in a device. The objective of burn-in is to eliminate all potential failure likely to occur at the early phase of the product life time (also called Infant Mortality Failure). It can easily be observed in a typical reliability bath tub curve as shown below.

ALTER Projects, ENDURANCE, ENVIRONMENTAL & RADIATION, TESTING

Full Authority Digital Engine Control

Posted by doEEEt Media Group
On January 13, 2020
0

When aircraft manufacturers started to install just two seats instead of three in airliner cockpits in the 1980s, this was something of a mini-revolution. Since that time, planes have generally been flown by just the pilot and co-pilot.

EEE Components, INSPECTION, ELECTRICAL & VERIFICATION, PASSIVES, PHYSICAL, MECHANICAL & ASSEMBLY, SPECIFICATIONS / QPLs, TESTING

Cracking Problems in Low-Voltage Chip Ceramic Capacitors

Posted by doEEEt Media Group
On October 14, 2019
0

Guidelines for Selection of Ceramic Capacitors for Space Applications: Cracking Problems in Low-Voltage Chip Ceramic Capacitors

INSPECTION, ELECTRICAL & VERIFICATION, TESTING

High Rel Principles and Verifications in Solid Tantalum Capacitors

Posted by Kemet Electronic Corporation
On October 2, 2019
0

Typical short circuit failure mode in Tantalum capacitors can lead to significant damage to the adjacent circuit board, and 50%voltage de-rating alone is not sufficient to address this problem.

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