Issue 223 of ESCC QUALIFIED PART LIST (QPL)
- Posted by Javier Alejandro de la Ossa Fernández
- On January 21, 2022
- 0
The changes in issue 223 of ESCC QUALIFIED PART LIST (QPL) are included in the DCR 1480 and detailed herein below:
Extension (the validity date of the certificate is extended, and the scope is not changed, which means no new components are included):
The following list of certificates was extended:
- Certificate 184P from IRCA RICA (Italy). This certificate covers Heaters Flexible Single and Double Layer included in detail specification ESCC 4009/002.
- Certificate 330D from IRCA RICA (Italy). This certificate covers Heaters Flexible Single and Double Layer included in detail specifications ESCC 4009/004.
- Certificate 245K from Infineon (Germany). This certificate covers RF-Microwave Bipolar Transistors based on type BFY 450 included in detail specification ESCC 5611/008.
- Certificate 319E from Infineon (Germany). This certificate covers MOSFET N-Channel based on type BUY**CS*** included in detail specifications ESCC 5205/026, ESCC 5205/027, ESCC 5205/028, ESCC 5205/030.
- Certificate 339C from Infineon (Germany). This certificate covers MOSFET N-Channel based on type BUY 15CS included in detail specification ESCC 5205/031.
- Certificate 360A from Infineon (Germany). This certificate covers MOSFET N-Channel based on type BUY65CS08J-01, BUY65CS28A-01 included in detail specification ESCC 5205/033.
- Certificate 363A from Infineon (Germany). This certificate covers MOSFET N-Channel based on type BUY 06CS included in detail specification ESCC 5205/032.
- Certificate 256L from Vishay (Germany). This certificate covers Film Resistors based on type MS1 included in detail specification ESCC 4001/022.
- Certificate 333C from Rakon (France). This certificate covers Crystals TO-5 CAN include in detail specification ESCC 3501/018.
- Certificate 334C from Rakon (France). This certificate covers Crystals TO-8 CAN include in detail specification ESCC 3501/019.
Read more about Space-Qualified Crystal Oscillators in Space
Extension with re-scope:
- Certificate 227J from Infineon (Germany). The qualified range has been extended, and now it will cover variants 04 and 05 from ESCC 5512/020, variant 03 from ESCC 5513/017, and variants 09 and 10 from ESCC 5513/030. This certificate affects RF-Microwave Schottky Diodes based on type BAS 40 and BAS 70 and RF- Microwave PIN Diodes based on types BXY42, BXY43, and BXY44.
- Certificate 230K from Infineon (Germany). The qualified range has been extended, and now it will cover variant 09 from ESCC 5611/006. This certificate affects RF-Microwave Bipolar Transistors based on type BFY 193.
- Certificate 322E from Infineon (Germany). The qualified range has been extended, and now it will cover variant 05 from ESCC 5611/010. This certificate affects RF-Microwave Bipolar Transistors based on type BFY 640, 640B, 650B, and 740B. The detailed ESCC 5611/009 and ESCC 5611/011 are also under this certificate, but their qualified ranges haven’t been modified.
Editorial:
- Certificates 109Q and 110Q have been updated with a new manufacturer name. AVX (TPC) France has changed its name to Kyocera AVX Components (France).
- Certificates 196J and 366 have been updated with a new manufacturer name. AVX Czech Republic has changed its name to Kyocera AVX Components s.r.o (Czech Republic).
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Technical Content Maintenance Team of doEEEt platform. at Alter Technology
Javier de la Ossa has a Degree in Industrial Electronic Engineering. He works in Alter Technology as part of the Technical Content Maintenance Team of doEEEt platform.
With the continuous maintenance of the platform technical content, doEEEt provides to the space community the most updated and complete information about Hi-Rel EEE components, related documentation, and reports, as well as any associated procurement and testing activities.
With the continuous maintenance of the platform technical content, doEEEt provides to the space community the most updated and complete information about Hi-Rel EEE components, related documentation, and reports, as well as any associated procurement and testing activities.
Latest posts by Javier Alejandro de la Ossa Fernández (see all)
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