C-SAM - Short Technical Notes, EEE Components, INSPECTION, ELECTRICAL & VERIFICATION, PASSIVES, TESTING
Scanning Acoustic Microscopy (C-SAM) of in Stacked Capacitors
- Posted by Francisco Javier Aparicio Rebollo
- On June 12, 2020
- 0
Scanning Acoustic Microscopy (C-SAM) inspection has been used for the comprehensive inspection of the lead-frame in a horizontally stacked capacitor. This non-destructive inspection reveals minor anomalies at the interface with capacitor terminals which may impair the electrical response.