Ultrasonic Examination of Ceramic Capacitors by Scanning Acoustic Microscopy
- Posted by Francisco Javier Aparicio Rebollo
- On May 18, 2020
- 0
Ultrasonic Examination of Ceramic Capacitors by Scanning Acoustic Microscopy (SAM) has proved to be the most effective tool for the non-destructive detection of very thin (even below 200 nm of thickness) internal anomalies (delamination, voids, cracks, and foreign material) within ceramic capacitors and other EEE parts