Alter Technology SAM Additional Testing Capabilities
- Posted by Francisco Javier Aparicio Rebollo
- On January 29, 2020
- 0
Among the test flow where SAM microscopy is used, other tests are carried out in which Alter Technology also has extensive experience, giving its customers the possibility of doing all the necessary tests with our expert engineers, offering support and follow-up at all times thanks to Virtual Lab; where immediate access is generated and in real time to all the information on the parts examined.
Phases of Evaluation and Qualification in Electronic Components
- Posted by Manuel Padial Pérez
- On February 2, 2020
- 0
During the Evaluation phase, components/technologies can be expensively characterized and margins determined.
If the evaluation is successful we can then proceed with Qualification, on components produced strictly as defined in the final PID (Process Identification Document) and from a given lot (actually, the first production lot).
Once qualified, the component is listed in the QPL (Qualified Part List).
Issue 39 of EUROPEAN PREFERRED PARTS LIST (EPPL)
- Posted by Emilio Cano García
- On March 10, 2020
- 0
The changes in issue 39 of EUROPEAN PREFERRED PARTS LISTS (EPPL) are included in the DCR 1310 and detailed in this post
CHARACTERIZATION OF STRAIN GAGES
- Posted by Juan Barbero
- On February 16, 2022
- 0
The Strain Gages are used to measure the deformation of materials. These devices are widely used when the deformation of a structure is relevant such as the wings of a plane or the structure of telescopes or rockets. The necessity of testing these strain gages at a wide temperature range leads to the necessity of coupling force-deformation equipment to climatic chambers.
SOLAR CELLS
- Posted by José Cándido Vázquez Cárdeno
- On February 24, 2020
- 2
Solar panels are required to have more output power and less weight and volume, namely, higher specific power and lower storage volume. To meet these requirements, the simultaneous achievement of both efficiency improvement and weight reduction for solar cells is necessary.
Doing Failure Analysis in EEE Parts
- Posted by Mari Carmen López
- On March 29, 2020
- 0
Failure analysis is the process of analysing the component data or the component itself to determine the reason(s) for degraded performance or catastrophic failure of a component either, during component manufacturing and testing, during incoming inspection, or after delivery to the customer, at the final application. Since there are an infinite number of variables in play at any one time, it is important as a first step in any failure analysis to understand how and when the failure occurred.
Insulation Resistance, DCL Leakage Current and Breakdown Voltage
- Posted by doEEEt Media Group
- On February 22, 2023
- 0
This article explains some basic parameters of capacitors – insulation resistance, DCL leakage current, and breakdown voltage / withstanding voltage.
Equipment testing approach for New Space
- Posted by Eladio Montoya Redondo
- On July 2, 2021
- 0
Lower level testing (subsystem, equipment, component) is frequently avoided, and the quality of these, given for granted. While this testing plan may be suitable for demonstration missions, we believe that shortly commercial missions will need a deeper quality assessment.