EMI Filters Selection Guide

Posted by doEEEt Media Group
On November 9, 2020
0

EMI is emitted by a number of both natural and engineered sources and is a hazard that virtually all electronic devices must be adequately protected from, regardless of application area. Board-level EMI suppression filters are one of the most common electromagnetic compatibility solutions and are widely available in a broad range of sizes, configurations, materials, capabilities, and costs.

ALTER Laboratory Services Brochures

Posted by doEEEt Media Group
On September 24, 2019
0

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INSPECTION, ELECTRICAL & VERIFICATION, TESTING

Alter Technology SAM Additional Testing Capabilities

Posted by Francisco Javier Aparicio Rebollo
On January 29, 2020
0

Among the test flow where SAM microscopy is used, other tests are carried out in which Alter Technology also has extensive experience, giving its customers the possibility of doing all the necessary tests with our expert engineers, offering support and follow-up at all times thanks to Virtual Lab; where immediate access is generated and in real time to all the information on the parts examined.

ENDURANCE, ENVIRONMENTAL & RADIATION, INSPECTION, ELECTRICAL & VERIFICATION, TESTING

Phases of Evaluation and Qualification in Electronic Components

Posted by Manuel Padial Pérez
On February 2, 2020
0

During the Evaluation phase, components/technologies can be expensively characterized and margins determined. If the evaluation is successful we can then proceed with Qualification, on components produced strictly as defined in the final PID (Process Identification Document) and from a given lot (actually, the first production lot). Once qualified, the component is listed in the QPL (Qualified Part List).

Failure Analysis

Posted by doEEEt Media Group
On May 15, 2019
0

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ACTIVES, EEE Components, PASSIVES, SPECIFICATIONS / QPLs

Issue 39 of EUROPEAN PREFERRED PARTS LIST (EPPL)

Posted by Emilio Cano García
On March 10, 2020
0

The changes in issue 39 of EUROPEAN PREFERRED PARTS LISTS (EPPL) are included in the DCR 1310 and detailed in this post

Non-standard testing, TESTING

CHARACTERIZATION OF STRAIN GAGES

Posted by Juan Barbero
On February 16, 2022
0

The Strain Gages are used to measure the deformation of materials. These devices are widely used when the deformation of a structure is relevant such as the wings of a plane or the structure of telescopes or rockets. The necessity of testing these strain gages at a wide temperature range leads to the necessity of coupling force-deformation equipment to climatic chambers.

ALTER Projects

SOLAR CELLS

Posted by José Cándido Vázquez Cárdeno
On February 24, 2020
2

Solar panels are required to have more output power and less weight and volume, namely, higher specific power and lower storage volume. To meet these requirements, the simultaneous achievement of both efficiency improvement and weight reduction for solar cells is necessary.

Small Sats Testing

Equipment testing approach for New Space

Posted by Eladio Montoya Redondo
On July 2, 2021
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Lower level testing (subsystem, equipment, component) is frequently avoided, and the quality of these, given for granted. While this testing plan may be suitable for demonstration missions, we believe that shortly commercial missions will need a deeper quality assessment.

INSPECTION, ELECTRICAL & VERIFICATION, PHYSICAL, MECHANICAL & ASSEMBLY, TESTING

Doing Failure Analysis in EEE Parts

Posted by Mari Carmen López
On March 29, 2020
0

Failure analysis is the process of analysing the component data or the component itself to determine the reason(s) for degraded performance or catastrophic failure of a component either, during component manufacturing and testing, during incoming inspection, or after delivery to the customer, at the final application. Since there are an infinite number of variables in play at any one time, it is important as a first step in any failure analysis to understand how and when the failure occurred.

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