A Novel Non-Destructive Inspection Technique to Detect Counterfeit Electronic Components
- Posted by doEEEt Media Group
- On October 21, 2020
- 0
Unverified or counterfeited electronic components pose a big threat globally because they could lead to malfunction of safety-critical systems and reduced reliability of high-hazard assets. Researchers at Cranfield University in the UK propose a new fast non-destructive method of electronic components inspection using pulsed thermography.