GRACE PROJECT: Electrical Characterization at 500°C

Posted by Juan Moreno Echarri
On January 24, 2022
0

Our Optoelectronics department knows how to fulfill this need. One of our customers requested that we carry a thermal cycling test at extreme temperatures (between 93ºC and -178ºC) over some VIS-NIR calibration sources (five samples at a time). At the same time, these sources were tested in vacuum conditions, and electro-optical characterization at different temperatures during cycling was requested.

Non-standard testing

Jupiter Icy Moons Explorer (JUICE) Program: Monitoring of JUICE Optical Fibers

Posted by Juan Barbero
On July 5, 2021
0

Monitoring of JUICE Optical Fibers During Thermal Cycles Keeping the Optical Connectors at Different Stable Cryogenic Temperatures in 3-Chambers Setup Two types of multimode fibers (50µm and 400µm) will be used for the scalar sensor of the JUICE (Jupiter Icy Moon Explorer program) magnetometer. This optical sensor will be placed at the end of a boom. These multimode fibers will transmit modulated laser light through the sensor, the light source, and the detector electronics being located within the spaceship.

Non-standard testing, TESTING

CHARACTERIZATION OF STRAIN GAGES

Posted by Juan Barbero
On February 16, 2022
0

The Strain Gages are used to measure the deformation of materials. These devices are widely used when the deformation of a structure is relevant such as the wings of a plane or the structure of telescopes or rockets. The necessity of testing these strain gages at a wide temperature range leads to the necessity of coupling force-deformation equipment to climatic chambers.

EEE Components, ENGINEERING AND PROJECT MANAGEMENT SUPPORT

PRODUCT ASSURANCE (PA) Support: What is and why it is important

Posted by Manuel Sánchez Ruiz
On September 28, 2020
0

Product Assurance (PA) stands as a fundamental pillar. Product Assurance can be defined as the set of requirements that materials, processes and parts must comply to assure proper performance of the equipment during the mission lifetime. These rules are gathered in a PA Plan.

Optoelectronics Components Testing

IR sources thermal vacuum cycling characterization

Posted by Alejandro López Moya
On July 19, 2021
0

Every time a component is tested in extreme temperature conditions, it becomes a challenge to design a reliable test setup. If in addition, components must be in vacuum conditions and electro-optical characterization is required at different temperatures, complexity increases exponentially.

Optoelectronics Components Testing

Thermal vacuum with video monitoring for HV optocouplers

Posted by Juan Moreno Echarri
On July 5, 2021
0

Exposure to vacuum may cause changes in filling isolating materials even at room temperature conditions. HV Optocouplers are used to connect two different circuits while maintaining high electrical isolation between them.

EEE Components, PASSIVES

Temperature Measurement and Silicon-Based Temperature Sensors

Posted by doEEEt Media Group
On August 10, 2020
0

Würth Elektronik Webinar for Industrial Applications

This webinar shows trends in temperature measurement. The different technology approaches of temperature sensors are shown.

In the further course, the focus will be on silicon-based temperature sensors with a digital interface.

In this context, the essential features of the new temperature sensor WSEN-TIDS from Würth Elektronik...

Optoelectronics Components Testing

Electrical characterization at 500ºC for GRACE project

Posted by Juan Moreno Echarri
On August 26, 2021
0

The GRACE project is framed within the main challenges of our society, particularly safe, efficient, and clean energy, while connecting with aspects of security, safety, and defense, as well as climate change and efficiency in the use of resources raw materials.

INSPECTION, ELECTRICAL & VERIFICATION, TESTING

Thermographic analysis Techniques used for EEE Parts

Posted by Emilio Cano García
On March 28, 2019
0

Thermographic analysis techniques used in Alter Technolgy : Infrared camera thermal maps, Thermal behavior of equipment and cabinets, Thermal analysis at customer specified temperature conditions. The analysis of the distribution of the dissipated heat in cabinets or enclosures gives relevant information for checking the reliability of a system and its components.

SiC Testing

SiC Reliability Testing for Bepi Colombo

Posted by doEEEt Media Group
On February 12, 2022
0

These diodes have been designed for harsh environment space applications such as inner Solar System exploration probes. More specifically these diodes are being tested to be the blocking diodes of the solar panels for the Bepi Colombo mission.

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