Phases of Evaluation and Qualification in Electronic Components
- Posted by Manuel Padial Pérez
- On February 2, 2020
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During the Evaluation phase, components/technologies can be expensively characterized and margins determined.
If the evaluation is successful we can then proceed with Qualification, on components produced strictly as defined in the final PID (Process Identification Document) and from a given lot (actually, the first production lot).
Once qualified, the component is listed in the QPL (Qualified Part List).
Image Sensor Assembly
- Posted by doEEEt Media Group
- On March 12, 2020
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Alter Technology (formerly Optocap), Image Sensor assembly platform is a flexible solution for CMOS, CCD and Focal Plane Array sensor chips into ceramic packages.
Thermal Vacuum Testing for Space Applications
- Posted by doEEEt Media Group
- On March 28, 2019
- 0
The environmental conditions in the space are extreme, the combination of low pressure and the extreme temperatures can cause the failure of a component. That is why we test the components in similar conditions.
Non-Linear Resistors: Thermistors, Varistors, Memristors
- Posted by doEEEt Media Group
- On June 22, 2023
- 0
The non-linear resistance behavior is successfully use to get specific features like sensors, limiters, ESD protection, self-balancing temperature stabilisation etc. using still a relatively simple and reliable passive component.
Replacing MLCCs with polymer capacitors
- Posted by doEEEt Media Group
- On December 7, 2020
- 0
With the continuing supply shortage for multi-layer ceramic capacitors (MLCCs), designers are being forced to consider alternatives. In this article, we will look at the factors to be considered if you’re thinking about using polymer capacitors as a replacement.
There has been a supply shortage of MLCCs since the end of 2016 and there are no signs of immediate improvement.
A Novel Non-Destructive Inspection Technique to Detect Counterfeit Electronic Components
- Posted by doEEEt Media Group
- On October 21, 2020
- 0
Unverified or counterfeited electronic components pose a big threat globally because they could lead to malfunction of safety-critical systems and reduced reliability of high-hazard assets. Researchers at Cranfield University in the UK propose a new fast non-destructive method of electronic components inspection using pulsed thermography.
Insulation Resistance, DCL Leakage Current and Breakdown Voltage
- Posted by doEEEt Media Group
- On February 22, 2023
- 0
This article explains some basic parameters of capacitors – insulation resistance, DCL leakage current, and breakdown voltage / withstanding voltage.
Mechanical Shock Test for Electronic devices
- Posted by María Teresa Rodríguez
- On October 8, 2020
- 0
The purpose of mechanical shock testing is to evaluate the reliability of devices subjected to severe shocks which might result from suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation.
Evaluation of the Radiation Hardness of GaSbbased Laser Diodes for Space Applications
- Posted by doEEEt Media Group
- On February 12, 2020
- 0
The study is focused on the effects of radiation on the Power-Current, Current-Voltage and Wavelength-Current-Temperature characteristics of the lasers. No significant radiation damage has been found.