Reliability Issues with Polymer and MnO2 Tantalum Capacitors
- Posted by doEEEt Media Group
- On January 25, 2021
- 0
for Space Applications
Alexander Teverovsky, Jacobs Engineering, Inc, NASA GSFC published a presentation that provides a comparative analysis of degradation processes, failure modes and mechanisms in MnO2 and polymer technology tantalum capacitors. Analyzed conditions include effects of vacuum and radiation, soldering (pop-corning), long-term storage, operation at high temperatures, stability at low and high temperatures, and anomalous transients. Screening and qualification procedures to assure the space-grade quality of conductive polymer tantalum capacitors (CPTCs) are suggested.
Advantages and Disadvantages of Conductive Polymer Tantalum Capacitors for Space Applications
Effect of Moisture
- CPTCs are more sensitive to moisture compared to MnO2 caps.
- Capacitance variations can reach 40% and DCL >10^4times.
Failures after Soldering
- Pop-corning, due to moisture increases delamination, introduces cracks in the package and might damage Ta2O5 dielectric.
- Cracks in packages facilitate penetration of oxygen that increases the rate of ESR degradation in CPTCs.
- Damage to dielectric causes first power-on failures in MnO2 capacitors. The effect has not been observed yet in CPTCs.
- Damage caused by soldering is lot-related.
- Pop-corning issues can be resolved by baking.
- Requirements for MSL testing should include measurements of ESR and surge current testing.
- Decrease of C in CPTCs is greater than in MnO2 capacitors.
- Soldering increases ESR in most types of capacitors, but the level of variations is lot-related.
- Soldering results in drying off capacitors by 50 to 93%
Effect of Vacuum
Drying in a vacuum has a similar effect as drying in the air:
- Decreasing of capacitance and DF;
- A relatively small changes in ESR;
- Variations of C and DF with V;
- Increasing of transient leakage currents, especially at low T.
Life Testing of Tantalum Polymer Capacitors
- No catastrophic failures during life testing and SSLT in 23 lots.
- CPTCs can operate reliably at high T at steady-state conditions.
- Increasing leakage currents with time is similar to MnO2 caps.
- Post-test DCL measurements might fail the limit.
- Erratic behaviour of currents in some samples/lots.
Recommendation for Specification & Qualification
General:
- CPTCs should be preconditioned before qualification testing.
- Life testing, HTS, and TS should be carried out using capacitors soldered per specified MSL.
- Testing for FR is not necessary for the following reasons:
- Field failures rarely happen at life test conditions;
- Uncertainty in AFs creates orders of magnitude errors in FR;
- Due to derating, actual FRs are orders of magnitude below the mission requirements;
- Most microcircuits that have been successfully used for space are non-ER components.
Screening (Gr.A) should include:
- Surge current testing. The existing MIL-PRF-55365 requirements limiting maximum current after 1 mseccan be used for CPTCs.
- Burning-in at 105 ºC 1.1VR for 40 hours.
LAT (or gr. B qualification test) should include:
- Life testing at 105 ºC, 1.1VR for 1000 hr.
- High-temperature storage test, 1000 hrat 125 ºC.
- Thermal shock, 100 cycles between -55 and +125 ºC.
- Testing after baking at 125 ºC for 168 hours:
- Surge current test at -55 ºC, 25 ºC, and +85 ºC.
- Stability at low and high temperatures (including DCL at low temperatures).
- Power cycling 100 cycles at RT and 0.75VR (5 sec ON/OFF using a power supply capable of rising voltage is less than 1 msec).
Source: NEPP.NASA.GOV
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