Mission Profile Evaluation for Automotive Applications An Anthology of Best Practices

1. Infineon at a Glance
2. AEC Q100 Rev. H
3. Mission Profile Definition
4. Automotive Applications Requirements
5. Reliability Basics
6. Acceleration Models
7. Examples of Mission Profile Evaluation
8. Summary and Perspective

Some applications need a high level of reliability!

Infineon (former Siemens Semiconductor) is an expert in handling special requirements and has an excellent reputation in the space community for over 40 years!

• • Infineon world wide customers value the high quality of the devices and appreciate the expertise in development and production.
  • The space heritage covers more than 1500 Satellites/Missions. Lifetime up to 15 years without any failure 
  • There are already more than 200 000 Infineon HiRel components in Space.  
  • The product range covers Radiation Hard PowerMOS Transistor MW-Transistors, Diodes and PIN–Diodes 

• Link to webpage: www.infineon.com/space

• • Failure Mechanism Based Stress Test Qualification for Integrated Circuits
  • Connect operating mission profile to a temperature grade
  • Introduce section “Method to Assess a Mission Profile” 
    • Demanding loading profile
    • Extended service lifetime requirement
    • More stringent failure rate target over lifetime

Please note:

• These requirements apply to the (passenger) vehicle in a more or less private use
• Subsystems and ECUs within the vehicle already today face different lifetime requirements.
• A different user profile may result in totally different lifetime requirements. Commonly, sources for that kind of requirements are commercial vehicles and trucks.

• A first glimpse at lifetime models

Arrhenius Model

• Assumption
  • An IC-device shall run 8000h operation hours in 15 years in a given mission profile
• Problem Statement
  • The  IC device  shows an increase  of the Tj  of  15°C  at Vmax.  

What  is the  minimum equivalent stress time when running HTSL and HTOL stress tests at Tamb = 150°C (oven temperature) in order to cover the given mission profile?

• • Ea = 0.7eV (typical gate oxide failure mechanism); Ea = 1.0 eV (package effects)
  • Consider passive time up to 15 years at an average temperature, e.g. 13°C

Arrhenius Model

HTOL

• • Ea = 0.7eV (typical)

Sensibility Analysis

• • Most of known failure mechanisms
  • Robustness margin

• Coffin Manson
  • Mission profile arbitrary chosen, corresponding to “Automotive Application Questionnaire for Electronic Control Units and Sensors”, ZVEI, October 2006
  • TC test runs within -55°C and 150°C
  •  ΔTj in operation is 15°C
  •  11000 cycles (number of engine on/off cycles over 15 years of use, 2 cold starts per day

• Peck

• Acceleration models well known over 30 years
• Challenges for applying acceleration models to new technologies
  • Cu wires (AEC 006)
• Accurate computational methods, e.g. cohesive finite element simulations

Increasing reliability knowledge is striving for quality!

Thank you!