DC power – Use of Substrate Attach Strength – Die Shear Strength Method
- Posted by José Cándido Vázquez Cárdeno
- On February 13, 2019
- 0
The purpose of the test is to determine the strength of the element attachment system when subjected to force in the Y1 axis, and thus to determine the integrity of materials and processes used to attach semiconductor die or surface mounted elements to package headers or other substrates. The implementation of this test includes material evaluation and process control.