Evaluation of Optical switches without moving parts

Posted by David Poudereux Sánchez
On January 27, 2022
0

The most relevant result of this work is that all tested samples passed satisfactory the test without relevant changes in the measured parameters, with the exception of one of the WG-EO switches which had a catastrophic failure, as it will be commented later. The pass/non-pass criteria were defined comparing the results of the electro-optical characterization after each test with the corresponding results for each parameter prior to the tests, taking into account the measurement uncertainty.

Optoelectronics, TESTING

Lasers Endurance Characterization in Vacuum Conditions – Test Setup

Posted by Alejandro López Moya
On January 25, 2022
0

Laser diodes characterization can be hard due to the laser’s nature. In the case of lasers, perfect control of current and temperature applied is mandatory. In addition, a good heat dissipation must be provided to avoid lasers being damaged. Special and complex equipment is required for a perfect characterization because accuracy is a must with thi

Optoelectronics, TESTING

GRACE PROJECT: Electrical Characterization at 500°C

Posted by Juan Moreno Echarri
On January 24, 2022
0

Our Optoelectronics department knows how to fulfill this need. One of our customers requested that we carry a thermal cycling test at extreme temperatures (between 93ºC and -178ºC) over some VIS-NIR calibration sources (five samples at a time). At the same time, these sources were tested in vacuum conditions, and electro-optical characterization at different temperatures during cycling was requested.

Optoelectronics, TESTING

Calibration Sources in Vacuum Conditions

Posted by Alejandro López Moya
On January 13, 2022
0

Optoelectronics, TESTING

Thermal Vacuum For HV Optocouplers – Video Monitoring

Posted by Juan Moreno Echarri
On January 12, 2022
0

Laser screening tests are done to comply with users’ requirements; two different challenges must be addressed. First, high-power lasers (30watts in this case) require specific test setups and important safety considerations to avoid dangerous situations in case of DUT/setup failure.

Optoelectronics, TESTING

High power laser screening test for samples Burn-In

Posted by doEEEt Media Group
On January 12, 2022
0

ALTER Laboratory Services, EEE Components, TESTING

Introduction to single events radiation effects

Posted by doEEEt Media Group
On December 20, 2021
0

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INSPECTION, ELECTRICAL & VERIFICATION, TESTING

Scanning Microscopy Equipment our new adquisition

Posted by Francisco Javier Aparicio Rebollo
On December 13, 2021
0

ALTER TECHNOLGY upgrades its Scanning Acoustic Microscopy capabilities. Alter Technology has upgraded its Scanning Acoustic Microscopy capabilities by acquiring a new FineSAT V acoustic microscope from Hitachi. FineSAT V, the high-end model of the FineSAT series, combines advanced inspection features with the faster inspection speed currently available in the market.

INSPECTION, ELECTRICAL & VERIFICATION, TESTING

Industry Applications where C-SAM is used

Posted by Francisco Javier Aparicio Rebollo
On November 29, 2021
0

C-SAM is a reliable and powerful tool for the non-destructive testing of microelectronic parts and base materials. Moreover, it is mandatory for different applications such as those described below for different sectors. In order to provide a fast reply to our customer needs our Virtual Lab platform for Remote Testing grants immediate access to our test results and fast communication with our engineers during and after the test.

ALTER Laboratory Services, INSPECTION, ELECTRICAL & VERIFICATION, Plastic Packaging for Space

Are there Voids in your IC Plastic Molding?

Posted by Raquel Cano Cordero
On November 10, 2021
0

Voids are defined as a lack of material within the bulk of the moulding compound and are common in ICs since they appear during improper molding manufacturing (injection, extrusion, etc.) and curation.

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