This article investigates the impedance of the three standard passive circuit components (R, L, and C) as well as the frequency response of a PCB trace. It is shown that a PCB trace can be modeled as a resonant RLC network just like the standard components and effectively constitutes the fourth circuit component whose frequency behavior directly affects the impedance of the resistors, inductors, and capacitors on a PCB.
Current limiting is a basic block element of any power supply. Many electronic devices are powered almost 100% of the time and are usually unattended, and therefore safety methods like current limit devices are essential to protect and improve the good performance of the equipment. In this sense, current protection is even more important in space applications, not only because of the criticality of the missions and the unavailability of repair but also because the possibility of Single Event Latch-up
Decapsulation of packaged devices exposes the internal elements of the device under test. Opening devices by this method allows the inspection of the die, interconnects and other features typically examined during failure analysis (FA), constructional analysis (CA) and destructive physical analysis (DPA).
Knowles Capacitors explains the ins and outs of chips capacitors – their properties, product classifications, test standards, and use cases. In the next article, manufacturers’ MLCC chip visual standards are explained.
The video shows how Kemet’s KC-LINK capacitors are tested for ripple current rating and ESR. These surface mount capacitors are designed to meet the growing demand for fast-switching wide bandgap (WBG) semiconductors that operate at higher voltages, temperatures, and frequencies.
SAM, The Preferred Method For The Non-Destructive Internal Inspection. Scanning Acoustic Microscopy of COTS and plastic encapsulated microelectronics.
Confocal Scanning Acoustic Microscopy (C-SAM) has proved to be the most effective non-destructive approach for the screening of COTS parts and the detection of latent internal anomalies in PEMs, either before soldering or for assembled systems.
SEM available high magnification tool to analyze the design, construction or handling defects. It can be used to check the interconnect metallization on an integrated circuit: metal step coverage, etc., or for performing an in-depth technology study: reverse engineering, die cross sectioning, failure analysis, etc.
Bepi Colombo will provide an understanding of Mercury to date. It consists of two individuals orbiters, Mercury Planetary Orbiter & Magnetospheric Orbiter