C-SAM - Short Technical Notes, INSPECTION, ELECTRICAL & VERIFICATION, TESTING

Doing a Confocal Acoustic Inspection on Optoelectronic Components

Posted by Francisco Javier Aparicio Rebollo
On July 3, 2019
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An Infra-red led emitter is inspected by scanning acoustic microscopy. Probe frequency is adapted to the characteristics of the system. In this case, considering the large thickness of the package a 50 MHz transducer is used. Our phase inversion algorithm identifies and highlights the delaminated areas. In addition, A-scan inspection is used to confirm these findings.

C-SAM - Short Technical Notes, INSPECTION, ELECTRICAL & VERIFICATION, Plastic Packaging for Space, TESTING

Inspection of thick EEE plastic encapsulated parts – CSAM Services

Posted by Francisco Javier Aparicio Rebollo
On June 27, 2019
0

High-resolution inspection of plastic encapsulated systems with complex internal architectures requires of confocal imaging techniques to block out-of-focus features that otherwise impair the resolution and the image quality.