Announcing new features in doEEEt to find the right COTS components

Posted by doEEEt Media Group
On November 9, 2022
0

Announcing new features in doEEEt to find the right COTS components With the label classification system in gold, silver, and bronze, doEEEt users will have useful information about the COTS components available in ALTER’s new catalogue and select them more straightforwardly and reliably.

COTS components, PASSIVES

Five Key Filter Specifications

Posted by doEEEt Media Group
On August 17, 2022
0

To select the ideal filter for your application, you first need to understand how to define your filtering requirements, as these requirements will ultimately determine the specifications of your filter.

COTS components

Testing for COTS components

Posted by doEEEt Media Group
On July 11, 2022
0

ALTER offers a global solution to COTS components testing, such as life cycle (obsolescence) or counterfeit detection, integrating all required steps into the supply and testing chain and providing alternative solutions and risk-mitigation strategies

COTS components

COTS in space: Does delamination really cause critical failures?

Posted by Emilio Cano García
On April 20, 2022
0

One of the biggest cons of COTS is the plastic package. Plastic can cause outgassing, coating nearby components in chemicals that cause corrosion. Besides, the non-hermetic sealing can also allow humidity into packages, ultimately leading to corrosion of the semiconductor inside.

COTS components

Qualifying COTS components at a reduced cost

Posted by José Carlos Muñoz
On November 16, 2020
0

In this post, you can read all the questions launched by the attendees, as well as all the answers offered by the speaker.

COTS components

What are COTS space components?

Posted by doEEEt Media Group
On August 11, 2020
0

The drive to use COTS (Commercial Off-The-Shelf) components in the space industry is growing since these parts allow to obtain higher performance at the system level, which is difficult to obtain using currently available space components. However, the use of COTS components has an inherent risk because of the lack of confidence in the traceability and the long-term performance of these parts as well as the new concerns affecting mostly this type of products (RoHS, counterfeit parts, long-term reliability, etc.).

COTS components

What is a COTS grade capacitor?

Posted by doEEEt Media Group
On August 8, 2020
0

COTS capacitor is produced using the same materials and processes as a standard commercial-grade product that is then “up-screened” using Mil-Spec drawings to provide a high reliability component

C-SAM - Short Technical Notes, COTS components

How to protect your COTS parts during C-SAM inspections

Posted by Francisco Javier Aparicio Rebollo
On July 7, 2020
0

The current post describes the different measures taken during Scanning Acoustic Microscopy (SAM) inspection to avoid potentially harmful effects associated with water immersion. Internal visual inspection conducted after decapsulation shows the successful prevention of corrosion phenomena in these samples.

COTS components

COTS in space applications: evolution overview

Posted by Dan Friedlander
On February 25, 2020
0

This paper attempts to suggest different issues to be tackled in order to meet technical, quality assurance, and cost requirements using COTS. The term “COTS” in this paper refers to commercial EEE Parts, including plastic encapsulated active ones.

COTS components

The application of laser SEE testing as a new radiation effects validation and screening technique for COTS components

Posted by Richard Sharp
On December 3, 2019
0

Pulsed lasers are excellent tools for the rapid screening of large numbers of parts, whether simply for latch-up or for more detailed SEE investigations. Package preparation is simpler than for heavy ion testing as no die thinning is required. Both front-side (wire-bonded devices) and back-side (flip chips) lasing can be applied. The ability to lay down very large arrays of, e.g. 10,000 laser spots under automatic control with a precision of 1 micron gives the advantages of microbeam and broad beam testing in one system. Device manufacturers can use the technique to identify sensitive areas on a die at an early stage in the design process, saving time to market and reducing costs.

Page 3 of 41 234