Testing of Small Space Equipment

Posted by doEEEt Media Group
On November 30, 2021
0

A space simulation system, developed entirely by the Optoelectronic department, has been implemented for some time. This system has managed to reach pressure values of 10-7mbar and temperatures between -100ºC and 150ºC. Thanks to the new cryogenic shielding shroud, it can absorb the equipment’s infrared radiation and achieve a great thermal homogeneity.

ALTER Laboratory Services, INSPECTION, ELECTRICAL & VERIFICATION, Plastic Packaging for Space

Are there Voids in your IC Plastic Molding?

Posted by Raquel Cano Cordero
On November 10, 2021
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Voids are defined as a lack of material within the bulk of the moulding compound and are common in ICs since they appear during improper molding manufacturing (injection, extrusion, etc.) and curation.

ALTER Projects, Optoelectronics Components Testing

Near-infrared, visible and ultraviolet LIDAR echo emulator

Posted by doEEEt Media Group
On October 26, 2021
0

Space agencies have carried out numerous research projects to develop systems to detect and quantify the concentration of Greenhouse gases, such as carbon dioxide and methane, which are the main drivers of climate change. The measurement system used for this purpose is called LIDAR (Light Detection and Ranging).

ALTER Laboratory Services, ENGINEERING AND PROJECT MANAGEMENT SUPPORT

Semiconductors Industry Shortage

Posted by Eva Díaz
On October 25, 2021
0

Semiconductors are essential for any digital product (on the rise) in practically all industrial sectors. Their demand has multiplied due to changes in habits during the pandemic. Worldwide shortages, including raw material ones, continue to heavily impact production and manufacturing capacity leading to tight supply, extended lead times, and increased pricing, and production stoppages in some manufacturing plants in industries like the automotive one, but not only worldwide level.

Optoelectronics Components Testing

Electro-optical characterization of 25 Gbps/s Optical Transceivers

Posted by Alejandro Rosado Pérez
On October 8, 2021
0

Optical transceivers are small photonics devices that can transmit and receive information at high transmission rates. These kinds of photonics chips are constituted by two differentiated parts: the transmitter, and the receiver.

Non-standard testing

Characterization of Strain Gages at Harsh Environments

Posted by Juan Barbero
On October 8, 2021
0

The Strain Gages are used to measure the deformation of materials. These devices are widely used when the deformation of a structure is relevant such as the wings of a plane or the structure of telescopes or rockets.

ALTER Laboratory Services, ENDURANCE, ENVIRONMENTAL & RADIATION, INSPECTION, ELECTRICAL & VERIFICATION, TESTING

New climatic chamber

Posted by doEEEt Media Group
On October 6, 2021
0

New acquisition will allow us to increase our current Environmental capabilities and offer the best price and delivery time in the market for the thermal treatment of your products, PCBs, as part of the Product Validation according to most of the industry standards ECSS-Q-ST-70-08C, ECSS-Q-ST-70-38C, JESD22-104, IEC 61646 10.11, IEC 60068-3-5…

SiC Testing

SiC Testing: Heavy Ions tolerant SiC diodes

Posted by doEEEt Media Group
On October 4, 2021
0

Alter RADNEXT Transnational Access reviewers have accepted technology HISiC (Heavy Ions tolerant SiC diodes configurations) project proposal with H2020 funding. SiC weakness under heavy ions radiation is not a secret. The radiation improved SiC multi-die configuration modules will be tested in this project, demonstrating SOAs (Safe Operating Area) up to voltages requested by industry.

Optoelectronics Components Testing

Photonic Integrated Circuits radiation for harsh environments

Posted by David Poudereux Sánchez
On September 23, 2021
0

The satellite market is experiencing a paradigm shift with the photonics penetration in every part of the satellite payload. Although some advances have been done with the introduction of optical interconnects in a commercial digital processor of a satellite payload.

Optoelectronics Components Testing

Calibration sources characterization in vacuum conditions

Posted by Alejandro López Moya
On September 23, 2021
0

One of our customers requested that we carry a thermal cycling test at extreme temperatures (between 93ºC and -178ºC) over some VIS-NIR calibration sources (five samples at a time). At the same time, these sources were tested in vacuum conditions, and electro-optical characterization at different temperatures during cycling was requested.

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