Cleanliness space hardware with plasma | Electronics plasma cleaning

Posted by doEEEt Media Group
On February 21, 2020
0

Surface contamination involving micrometric particles, microbiological agents, molecular adsorbate and others, represent a significant hazard in many areas of industry. For instance, high-level cleanliness is a critical requirement that any EEE device has to fulfil at any development stage: from the fabrication process of single components, before encapsulation, to the final PCB assembly.

ALTER Innovation

New Materials & Technologies

Posted by doEEEt Media Group
On February 21, 2020
0

New Materials & Technologies: Our Innovation Department is open to new challenges and developments adjusted to customer requirements

ALTER Innovation

A method of space radiation environment reliability prediction

Posted by doEEEt Media Group
On February 21, 2020
0

Based on space radiation failure mechanism and statistical characteristics, a method of space radiation environment reliability prediction is setup upon failure physics, which expands the application domain of reliability prediction. • To be applied to reliability design for future space vehicles.

ALTER Innovation

Very Extreme temperature Testing Parts

Posted by doEEEt Media Group
On February 21, 2020
0

Full ESCC evaluation ID and HIF Sensitivity evaluation of SiC of Silicon capacitors including thermal characterization at > 200ºC. Very Extreme temperature Testing Parts Reliability testing Endurance test Gamma and Heavy ions tests

ALTER Innovation

Bakeout and very Extreme temperature Testing Facilities

Posted by doEEEt Media Group
On February 21, 2020
0

8 cryogenic chambers with a temperature range from -195ºC to +400ºC and ramps up to 40ºC/min. Dimensions up to 90x50x35cm.

ALTER Innovation

New test methodologies

Posted by doEEEt Media Group
On February 21, 2020
0

Specific test development including external motion vacuum feed-through with controlled displacement are included in New Test methodologies

ALTER Innovation

Very Extreme temperature Testing Examples

Posted by doEEEt Media Group
On February 20, 2020
0

All-optical & electrical parameters of different families of electronic components (Electro-optical, ASIC, RF, Discrete components, passive parts, new materials, etc…) can be characterized to asses usability of parts under such environment.

ALTER Innovation

Reliability of Liquid Crystals in Space Photonics

Posted by doEEEt Media Group
On February 19, 2020
0

Passive liquid crystal (LC) devices are becoming an interesting alternative for the manufacturing of photonic devices in spatial applications. These devices feature a number of advantages in this environment, the lack of movable parts, and of exposed electronics being among the most outstanding ones.

ALTER Innovation

SEE testing on GaAs test vehicles. Methodology, Results and Derating.

Posted by doEEEt Media Group
On February 19, 2020
0

Radiation sensitivity of GaAs components is not really well known, compare to other technologies. Traditional radiation harness policy consisted in a good derating in DC bias conditions to ensure operation inside a known or expected DC safe operating area (SOA).

ALTER Innovation

Experience on SEE testing EEE parts

Posted by doEEEt Media Group
On February 19, 2020
0

Many basic testers available which offer the capability to carry out a test in a rather short delay (a few weeks) at a relatively low cost. Capability to develop on-demand test setup for complex devices (μP High-frequency devices, RF fixtures etc…) higher cost driven by the test preparation effort.

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