Experience on SEE testing EEE parts
- Posted by doEEEt Media Group
- On February 19, 2020
- 0
Many basic testers available which offer the capability to carry out a test in a rather short delay (a few weeks) at a relatively low cost.
Capability to develop on-demand test setup for complex devices (μP High-frequency devices, RF fixtures etc…) higher cost driven by the test preparation effort.