Evaluation of the COTS Google Coral Edge TPU processor for high-performance AI computing in space
- Posted by doEEEt Media Group
- On August 1, 2023
- 0
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Assurance of the long-term availability of COTS components through specific storage methods and related risk factors
- Posted by doEEEt Media Group
- On August 1, 2023
- 0
To ensure the availability of series production or spare parts, long-term storage of critical components is nowadays inevitable.
Aging processes and their risk factors for storing illustrate that simply storing the required electronic components in nitrogen dry packs is insufficient to permanently ensure their future reliability.
New Techniques for COTS assembly verification
- Posted by doEEEt Media Group
- On August 1, 2023
- 0
New Space requires a new point of view in the way of doing things in many aspects. One of these aspects is the assembly verification process. A change from testing to assembly verification models is needed to reduce the time and cope with the COTS packages.
COTS and implication on assembly verification and reliability: ESA Approach
- Posted by doEEEt Media Group
- On August 1, 2023
- 0
Cots utilization requires a different approach to assessing the reliability of the assembly processes. A brief overview of the difference between the high rel with a high rel assembly built to ECSS standard is provided, and the approach identified in the ESA Cots guidelines for assessing the assembly processes is briefly presented.
R2COTS experience for the selection and the procurement of COTS
- Posted by doEEEt Media Group
- On August 1, 2023
- 0
R2COTS solution addresses the main axes to watch out for when procuring and qualifying COTS components and offers the best trade-off between EEE requirements and the new space needs
COTS Wear Out Test for 15 years in Space use
- Posted by doEEEt Media Group
- On August 1, 2023
- 0
At the time of ACCEDE workshop, 4000H will already be performed; Presentation will be done on stress test conditions and on the first results (drift during Tests and Readouts).
Automotive Semiconductor Back End Test Methods and Product Reliability Monitoring
- Posted by doEEEt Media Group
- On August 1, 2023
- 0
This paper aims to give an overview of the usual control steps during the manufacturing of semiconductors at the back end of the line; testing methods used to improve the detectability of expected failure mechanisms, and even to reduce the failure rate by including screening steps by the final testing area and to show possible strategies for product reliability monitoring.
COTS selection and tests at Microchip France to support use in space applications
- Posted by doEEEt Media Group
- On August 1, 2023
- 0
From product selection to final qualification, Microchip will share methodology, process, and tools used for radiations assessment, radiations tests, and end plastic device qualification to bring COTS device at the space level
This presentation is planned to be done by our radiations engineering team located in Nantes, France.
Panel 2. “Industrial perspective and technical challenges for COTS usage in space”
- Posted by doEEEt Media Group
- On August 1, 2023
- 0
Interesting questions were addressed: How to manage the test process for new COTS Technologies? Will board-system level testing replace the component test?
The RADNEXT irradiation network and its related system level test activities
- Posted by doEEEt Media Group
- On August 1, 2023
- 0
The RADNEXT irradiation network offers various testing opportunities for radiation effects research applications and users, from academia to industry. As a complement to the transnational facility access, several Joint Research Activities are also part of the project.