Würth Elektronik Presents Radio Interference Suppression Ceramic Common Mode Filter

Posted by Dimas Morilla
On December 24, 2021
0

The high switching frequency of state-of-the-art data lines has made common-mode interference a problem in radio reception. The ceramic common mode choke WE-CCMF achieves excellent attenuation in just this 2.45 GHz range. The LTCC design of the WE-CCMF ensures low losses and high reliability.

INSPECTION, ELECTRICAL & VERIFICATION, TESTING

Results after the Tin Whisker Growth Investigations

Posted by Dimas Morilla
On December 4, 2020
0

An important starting point must be stressed that NONE OF THE “AS RECEIVED” SMD DEVICES POSSESSED WHISKERS. It was confirmed by performing a visual inspection. This was repeated by the company, with the help of the SEM, on the three lots of devices after each of the four runs for conditions of Temperature Cycling, and the Ambient- and High-Temperature/Humidity Storage.

PHYSICAL, MECHANICAL & ASSEMBLY, TESTING

Why do a Residual Gas Analysis?

Posted by Dimas Morilla
On August 28, 2020
0

Residual Gas Analysis, also known as Internal Gas Analysis (IGA), is a destructive test which is performed to examine the atmosphere inside hermetically sealed devices. The test procedure is based on milling the component so that the gas content can be extracted and subsequently analyzed. The measurement of the moisture content is of particular interest as it allows to determine whether the moisture criteria are met. Also, the measurement of all the other gases might be of interest as the gas content reflects upon the quality of the sealing process and can cause long term reliability problems such as corrosion, fogging, leakage, etc.

INSPECTION, ELECTRICAL & VERIFICATION, TESTING

Experiments done in Tin Whiskers Growth

Posted by Dimas Morilla
On July 30, 2020
0

Experimental Methods The surface mount device beads under study have two rectangular contacts at opposite sides. With bends of 90 degrees that have an approximately planar surface of 3.048 mm2 each. In order to comply with the standard JESD22-A121, 12 leads on at least 6 components must be examined, with an accumulated lead surface bigger than 75 mm2.

INSPECTION, ELECTRICAL & VERIFICATION, TESTING

Tin Whisker Growth Investigation Conclusions

Posted by Dimas Morilla
On April 4, 2019
2

It is important to be vigilant in the procurement of electronics components, particularly for space components, because once launched, they cannot be repaired and many spacecraft have intended lives of 14 years and some like Pioneer will continue communicating with Earth for more than 40 years.

INSPECTION, ELECTRICAL & VERIFICATION, TESTING

How and Why Tin Whisker Grow in Electronic components

Posted by Dimas Morilla
On April 4, 2019
0

The Tin Whisker is a conductive hairy-like crystalline structure of tin that grow spontaneously from a tinned surface, usually as a result of the stress of some sort, and maybe long enough to cause a big problem for those applications demanding a high level of reliability.